RCR Wireless Editorial Webinar: Trends In LTE Test And Measurement

Moderator: Dan Meyer, Editor-in-Chief, RCR Wireless News
Panelist: Mike Barrick, Senior Wireless Business Development Manager, Americas Sales Region, Anritsu
Panelist: Tony Opferman, Business Development Manager, Rohde & Schwarz
Panelist: Dave Allen, Market Development Manager, Agilent Technologies

Overview:
The deployment of LTE services is tasking the wireless industry with not just a new air interface, but with a whole new device, operating system and network ecosystem. This has placed a greater burden on those responsible for making sure that chipsets, devices, operating systems, and applications conform with industry interoperability and conformance standards while co-existing on both legacy and next generation networks.

Who should attend:
If your job, product launch or investment is dependent upon timely deployment of LTE chips, devices, applications and networks, you do not want to miss this webinar. Target audience for webinar includes:

-Lab and field test and measurement interoperability and conformance professionals, specifically chipset, carrier, equipment, device and software development companies
- Network and operations professionals
- Carrier executives and product manager
- Mobile analysts and investors

What you will learn:
Attendees will garner further insight into the test and measurement ecosystem and acceptance testing process from lab to field testing, conformance and interoperability standpoint.

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